Philips PW 6433/00 Secondary Electron Detector 943206433001 Microscope Part
Listing details
Review the original listing for condition, specifications and included components.
Philips Secondary Electron Detector Assembly
Model: PW 6433/00 | Electron Microscopy Core Component
Product Description
Available for purchase is a vintage, high-precision Philips Electron Optics Secondary Electron Detector (SED) Block Assembly. This hardware is a critical structural component engineered for surface topographical mapping applications on legacy Philips/FEI scanning electron microscopes (SEM) and scanning transmission electron microscope systems (TEM/STEM).
The assembly features its complete vacuum-chamber feedthrough probe, high-voltage teflon/ceramic insulation column, high-voltage coaxial bulkhead signal port, and heavy-duty braided copper grounding strap.
Technical Specifications
| Manufacturer | Philips Electron Optics (FEI / Thermo Fisher) |
| Detector Type | Secondary Electron Detector (SED) Assembly |
| Model / Type Number | PW 6433/00 |
| 12NC Factory Number | 9432 064 33001 |
| Serial Number | 0669 |
| Manufacturing Origin | Made in Holland |
Item Condition
- Cosmetics: Good physical and cosmetic condition. Anodized block housing shows clean factory labeling with intact high-voltage safety indicators.
- Hardware Status: Vacuum feedthrough surfaces are smooth, and the terminal probe connection shows no bent elements. Grounding strap braid is intact.
- Testing Note: Sourced via lab asset surplus. Removed from a decommissioned environment. Sold as-is, bench/functional testing unverified due to lack of an electron microscope host frame.
Professional Packing & Logistics
Electron optics assemblies are high-vacuum sensitive items. This unit will be heavily padded and dynamically wrapped in multi-layered defense packaging to isolate the probe tip and coaxial bulkheads during transit. Shipped fully tracked.